Embedded Avionics, Military

Marvin Test Solutions Expands TS-900 Platform with PXIe Architecture, RF Test Capabilities

By Juliet Van Wagenen | September 7, 2016
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Marvin’s TS-960e test platform
Marvin’s TS-960e test platform. Photo: Marvin Test Solutions

[Avionics Today 09-07-2016] Marvin Test Solutions has expanded the capabilities of its TS-900 PXI semiconductor test platform with the addition of the TS-960e system, which offers PXI Express (PXIe) performance and expanded test capabilities for RF devices and Systems on a Chip (SoC) applications. The TS-960e builds on the integrated open-architecture of the TS-900 platform and accommodates PXIe and PXI modules with the aim to provide high-performance digital, mixed-signal and RF test capabilities.
“Our semiconductor customers asked for an alternative to big-iron [Automatic Test Equipment] ATE systems that would combine the features of high-end ATE with the open architecture and benefits of the PXI standard,” said Steve Sargeant, CEO of Marvin Test Solutions. “With the addition of the TS-960e platform which incorporates our advanced GX5296 digital subsystem, a semiconductor software test suite, and an RF instrumentation option, we are able to offer our customers the flexibility and value of the PXI platform with the high-performance test capabilities typically found in ATE systems.”

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